Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design
A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach
(Author) Xiaowei Li
Format:
Paperback
£179.99
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Information
Publisher:
Springer Verlag, Singapore
Format:
Paperback
Number of pages:
None
Language:
en
ISBN:
9789811985539
Publish year:
2024
Publish date:
March 3, 2024