Pmp(R)/Capm(R) Exam Prep
A Basic Guide to Activity-On-Node and Critical Path Method
(Author) Jayanta K. Das Purkayastha
Format:
Paperback
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This thorough and in-depth preparation guide for PMP and CAPM exams covers precedence diagramming method/activity-on-node concepts and their analysis using Critical Path Method. Explanation of concepts through solved examples will provide readers hands-on ability for their application. This guide will serve as a launch pad for advanced study in this area beyond the requirements of the two exams.
Information
Publisher:
Booklocker Inc.,US
Format:
Paperback
Number of pages:
None
Language:
en
ISBN:
9781614345046
Publish year:
2011
Publish date:
Oct. 31, 2011