Secondary Ion Mass Spectrometry
Applications for Depth Profiling and Surface Characterization
(Author) Stevie Fred
Format:
Paperback
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Information
Publisher:
Momentum Press
Format:
Paperback
Number of pages:
None
Language:
en
ISBN:
9781606505885
Publish year:
2015
Publish date:
Sept. 15, 2015
Weight:
1 lb