Atomic Force Microscopy/Scanning Tunneling Microscopy 2 (1997)
(Author) Cohen Samuel H
Format:
Hardcover
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Information
Publisher:
Springer
Format:
Hardcover
Number of pages:
None
Language:
en
ISBN:
9780306455964
Publish year:
1997
Publish date:
April 30, 1997
Weight:
2 lb